Publications
Node Distortions in UiO-66 Inform Negative Thermal Expansion Mechanisms: Kinetic Effects, Frustration, and Lattice Hysteresis
S. M. Vornholt, Z. Chen, J. Hofmann, and K. W. Chapman
J. Am. Chem. Soc. 2024, 146, 25, 16977–16981, DOI: 10.1021/jacs.4c05313.

Probing Structural Transformations and Degradation Mechanisms by Direct Observation in SIFSIX-3-Ni for Direct Air Capture
M. L. Barsoum#, J. Hofmann#, H. Xie, Z. Chen, S. M. Vornholt, R. dos Reis, N. Burns, S. Kycia, K. W. Chapman, V. P. Dravid, and O. K. Farha
J. Am. Chem. Soc. 2024, 146, 10, 6557–6565, DOI: 10.1021/jacs.3c11503.
